LaboTex Workshops

1-day individual trainings conducted by LaboSoft experts

Workshop #1

Crystallographic texture analysis aided by LaboTex - The texture analysis software

Duration: 1-day, up to 6 people.

This course is intended for users of X-ray and neutron diffraction systems, EBSD systems and other interested parties who want to deepen their knowledge about possibilities of texture analysis aided by the software. It is designed for beginners who want to get started with the LaboTex program and experienced users who want to draw maximum benefit from the latest version of LaboTex software. The course contents includes fundamentals of texture analysis, data and results management, texture qualitative and quantitative analysis, experimental data processing (pole figures data, EBSD data), texture modeling, ODF calculation, complete pole figures recalculation from ODF, inverse pole figures calculation from ODF, and some anisotropy factors. In the practical part of the workshop the course participants will perform several exercises of texture analysis in relation to exemplary selected real materials.

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Outline

  • Fundamentals of 3-D Texture Analysis.
    • Orientation.
    • Orientation Distribution Function (ODF), Pole Figure (PF), Inverse Pole Figure (IPF).
    • ODF calculation (types of algorithms for ODF calculation, ADC /Arbitrarily Defined Cells/ method, ghost correction).
  • Symmetry aspects of 3-D texture analysis.
    • Crystal symmetry (CS) and sample symmetry (SS).
    • Space groups and symmetry elements for space groups.
    • Basic regions of ODF space in correlation to CS and SS.
  • Data sources and their formats for LaboTex:
    • Experimental data (X-Ray, neutrons, EBSD)
    • Model data
  • Pole figures processing in LaboTex.
    • Pole figures types in LaboTex.
    • Defocusing, background and phase corrections of pole figure data.
    • Preparation of pole figures to ODF calculations (symmetrization, rotation, pole figures cutting of regions).
    • ODF calculation options.
    • ODF symmetrization.
    • Interpretation of RP convergence factor.
    • Texture index.
    • Calculation of pole figures and inverse pole figures from ODF.
  • Qualitative texture analysis.
    • Texture orientations and texture components. Symmetrically equivalent positions in pole figures and ODF space.
    • LaboTex orientations data base. Edition of orientation database. Automation of orientation analysis.
    • Qualitative texture analysis on pole figures.
    • Qualitative texture analysis on ODF.
    • Reports from qualitative texture analysis.
  • Quantitative texture analysis.
    • Volume fraction of texture components - integration method. Volume fraction of texture components - model function method. Reports from quantitative texture analysis.
  • Analysis of inverse pole figures.
  • Texture modeling.
  • Fiber analysis (ODF sections, skeleton lines, fibers database).
  • Texture analysis on the basis of EBSD data or model data.
  • Calculation of anisotropy factors (Kearn s factors)
  • Sample reference system changes of ODF transformations.
  • Individual orientations set calculation from ODF.
  • Graphical possibilities in LaboTex (2D, 3D visualization).

Practical training

Course participants should bring their own PC-laptop (Windows 2000, XP, 2003, Vista)
  • LaboTex installation.
  • Basic information about LaboTex software
    • Data and results management (users, projects, samples, jobs).
    • LaboTex basic options.
    • Adjustment of pole figures registration convention to LaboTex convention.
    • High quality images options.
    • LaboTex reports development.
  • Texture analysis of aluminum.
    • Defocusing correction using texture standard samples.
    • Symmetrization options (monoclinic, orthorhombic, axial).
    • ODF calculation, texture index, RP factor, recalculated pole figures.
    • Qualitative ODF analysis (texture components recognition).
    • Quantitative ODF analysis (model function method).
    • Development of texture models.
  • Texture analysis of ferritic stainless steel.
    • Defocusing correction using the file with correction coefficients.
    • Fibers analysis.
    • Creations of ODF sections.
    • Creations of skeleton lines (skeleton lines options).
  • Texture analysis of copper deposit (orthorhombic and axial sample symmetry).
    • Qualitative ODF analysis (texture components identification).
    • Quantitative ODF analysis (model function method).
    • Quantitative ODF analysis (integral method).
    • Inverse pole figures analysis.
  • Texture analysis of thin layers with fiber texture.
    • Defocusing correction in thin layer from Schulz formula.
    • Finding of fiber direction.
    • ODF transformation (change of sample reference system).
  • EBSD data processing in LaboTex.
    • ODF calculation from sets of individual orientations.
    • Pole figures and inverse pole figures calculations.
    • Qualitative and quantitative texture analysis.
  • Texture calculations and analysis in low crystal symmetry materials (Zr,Ti, wood- cellulose, polypropylene and other polymers, etc.).

Workshop #2

Experimental & Interpretation Aspects of X-ray Based Crystallographic Texture Analysis

Duration: 1-day, up to 6 people.

This course is intended for users of X-ray and neutron diffraction systems, EBSD systems and other interested parties who want to deepen their knowledge about possibilities of texture analysis aided by the software. It is designed for beginners who want to get started with the LaboTex program and experienced users who want to draw maximum benefit from the latest version of LaboTex software. The course contents includes fundamentals of texture analysis, data and results management, texture qualitative and quantitative analysis, experimental data processing (pole figures data, EBSD data), texture modeling, ODF calculation, complete pole figures recalculation from ODF, inverse pole figures calculation from ODF, and some anisotropy factors. In the practical part of the workshop the course participants will perform several exercises of texture analysis in relation to exemplary selected real materials.

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Part I: X-ray diffraction experiments

  • Introduction to Wide-Angle X-ray Scattering (WAXS) technique
  • Registration of back-reflection and transmission (hkl)-pole figures
    • specificity of available apparatus (texture goniometers)
    • selection of radiation, beam optics and diffraction spectra
    • measurement grids and geometrical limits
    • coarse and ultra-fine grained materials
    • avoiding typical experimental mistakes
  • .
  • Measurement technique
    • symmetrical and asymmetrical geometry of measurement
    • pole figures conventions
    • pole figure window
    • PIM-and IM-methods of data collection
    • optimization of measurement parameters
  • Correction and normalization of experimental data
    • absorption, fluorescence, defocusing, penetration depths
    • normalization strategies
    • empirical formulae and reference samples
    • thin film/coating correction
    • statistical and crystallographic symmetry of sample
  • Data processing
    • extraction of texture signals for multi-phase and low-symmetry materials
    • fitting procedure associated with PSD-or pseudo-PSD detection techniques
    • interpolation of rough reflection/transmission data
    • verification of collected data (informative region of the pole figures)

Part II: Calculations and interpretation of texture functions

  • Uncertainty of experimental data
    • internal contradiction of the pole figures
    • tests of data quality
  • Relationship between 3D spatial arrangement (texture) and material properties
    • Intensity-, Amplitude-, Peak position, FWHM-and Background-pole figures
    • inverse pole figures of sample-associated directions
    • anisotropy of sample properties (plasticity, magnetism, corrosion proof, …)
    • texture and residual stresses
  • Texture tomography of the near-surface areas
    • evaluation of texture inhomogeneity
    • depth-profile of texture
    • texture inheritance

Part III: Routine and potential application of X-ray texture analysis

  • Controlling technology and diagnosing microstructure state
    • safety of exploitation
    • on-line control of quality
    • advanced materials
  • Examples and practical remarks
    • typical materials (metals, ceramics, polymers)
    • summary: texture analysis step-by-step